Showing results: 151 - 165 of 205 items found.
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Applied Image, Inc.
ISO has been the governing body for Image Quality Testing all over the world. To that end, APPLIED IMAGE is proud to be a participant in assuring that the industry has products that meet or exceed the requirements of ISO. Since ISO covers many levels, we provide test patterns of various types that can be used for Image Capture and Evaluation of Optical and Imaging systems of all types.
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SAJE -
SiliconAid Solutions, Inc.
SAJE is the SiliconAid Suite of JTAG related standards focused tools for chip development, verification, validation and patterns generation of ATE, Board, and System Test. Each tool can be used as a point tool by itself to compliment other tools in your flow. However, the SAJE Tool Suite used together in a flow can provide a total solution that also leveraging previous steps for debug and analysis.
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701A -
Teledyne LeCroy quantumdata
If you’re testing digital or analog computer monitors, video projectors, multimedia monitors, or TVs, the 701A Video Test Generators provides the signals, test patterns, and audio to do your job, easily and accurately. Field technicians and factory people on the move will appreciate the convenience of battery power and small size. The 701A Video Test Generator is designed to go where you go.
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3682-4 -
VECTOR Electronics and Technology, Inc.
44 Gold plated edge contacts (22 each side) on 0.156"(3.96mm) centers. Interleaved buses pattern on wiring side, solder coated for user convenience. Overall ground plane with clearance around each hole on component side. Mounts DIPs with 0.3”, 0.4” & 0.9” lead spacing. Unclad test point area at top of board. Row and column legends provided.
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CA9806-12 -
UC Instruments, Corp.
The UC INSTRUEMNTS CA9806-12 is a highp erformance, flexible 12 channels Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (200 G). It is combined with three sets CA9806 4 CH 1.0 to 17.0 Gbps Pulse Pattern Generator and Error Detector that incorporates an external one by 4 rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build-in 8.5 ~ 15 Gb/s eye diagram testing function.
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N4952A -
Keysight Technologies
The N4952A is an affordable and compact error detector remote head available in 4 to 17 Gb/s and 5 to 32 Gb/s configurations. Compatible with the N4960A Serial BERT controller, it is the perfect solution to test up to 32 Gb/s per channel for 100 Gigabit Ethernet applications and other high-data rate devices. The N4952A error detector supports PRBS or user patterns and operates up to 32 Gb/s in a single band with no gaps or missing data rates. The remote head allows the test equipment to be located very close to the device under test, eliminating the need for long cables that degrade signal quality.
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Model 27012 -
Chroma ATE Inc.
To meet the high accuracy and low price requirements for LCM TV test device, Chroma 27012 that integrates the signal and power source provide a complete test solution for LCD Module. Its LVDS, TTL (Option) signal source fully complies with the digital signal standard, meanwhile with the 24V, 12V, 5V, 3.3V DC source output it is able to supply power to VDD, Backlight for LCM test without obtaining external power source. Equipped with the interface of single key to switch the Timing, Pattern and Program rapidly for test in auto or manual mode, the 27012 is able to provide a direct and convenient test environment for LCM TV by its complete hardware configuration and easy operation.
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Tessent IJTAG -
Mentor Graphics Corp.
To manage the complex requirements of testing a heterogeneous set of embedded IP, the industry developed IEEE P1687 (IJTAG). It standardizes a language for describing the IP interface and how IPs are connected to each other. It also introduces a language that defines how patterns that operate or test the IP are to be described. IEEE P1687 draws a clear line between what must be covered by the standard and what is better left to the ingenuity of the tool developers.
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IMADA, Incorporated
These automated food testers are designed for clean, smooth trouble-free operation.Food Rheology testers automatically test firmness, elasticity or viscosity using a load cell combined with programmable movement control. The easy-to-use program dial and menu screens control probe positioning and speed. Select from three movement patterns. The USB port streams 1,000 force data/second to the Force Data Analysis Software (included).
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ScanaQuad Series -
Ikalogic s.a.s.
ScanaQuad (SQ) is a series of high performance 4 channels logic analyzers and digital pattern generators. They are designed to be your best companion when working on serial protocols like UART, SPI, I2C, 1-Wire, USB, I2S, CAN, LIN, RS232, RS485, and more. With ScanaQuad Logic Analyzers, you can capture signals, you can play them back, and you can even build genuine test signals and generate them!
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RT-3000/RG-1000F -
NAPSON Corp.
*Fully automatic system for large sizes of flat panel with glass loading robot*Tester self-test function, Measurement position correction function, wide measurement range*Min. 0.1 mm meas. resolution and user programmable test pattern*Host (CIM) communication and 2-D/3-D Mapping software
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Mentor -
Trilogy Broadcast
Precision Time Protocol IEEE-1588 PTP grandmaster• Multiple video and audio formats in one box• Simultaneous 525/625 and HD Tri Level Sync outputs• Highly accurate GPS reference for synchronisation and timecode• Vector web-browser setup and monitoring tool• Redundant PSU option• Add upgrades and options without return to factory• Generates synchronised audio and video• Redundant units with changeover• 4K test pattern ready (future upgrade)
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Chroma ATE Inc.
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Data Patterns Pvt. Ltd.
Modules in compact PCI from Data Patterns are available for Data Acquisition and Control, Simulation, Communication Automatic test equipment, Rugged systems, Fail-safe systems, Computer controlled logic controls, Plant automation and similar requirements. Other I/O functions available from our IP and Mezzanine Module families can be directly integrated into our cPCI systems.Data Patterns has also pioneered cPCI derivatives such as 9U High Voltage systems, Multiple backplane support with Hot Standby Switchover capabilities. Continuous innovation enables MMI options such as CRT & LCD displays, Keyboards, Pointing devices, Finger print security devices and so on.
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ImpactQA
AI and ML testing framework can efficiently recognize pitfalls and with constant updates to the algorithms, it is feasible to discover even the negligible error. Essentially, Artificial Intelligence (AI) and Machine Learning (ML) tech are well-trained to process data, identify schemes and patterns, form and evaluate tests without human support. This is made possible with deep learning and artificial neural networks when a machine self-educates based on the given data sets or data extracted from an external source such as the web.
